(Record no. 64399)

MARC details
000 -LEADER
fixed length control field 00492nam a22002057a 4500
005 - DATE & TIME
control field 20250521113604.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 250521b |||||||| |||| 00| 0 eng d
020 ## - ISBN
International Standard Book Number 9780198089131
040 ## - CATALOGING SOURCE
Original cataloging agency Avior library kolkata
041 ## - Language
Language code of text/sound track or separate title english
082 ## - DDC NUMBER
Classification number 621.3815
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Sedra,Adel S
245 ## - TITLE STATEMENT
Title microelectronic circuits
Statement of responsibility smith
250 ## - EDITION STATEMENT
Edition statement 6th
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher, distributor, etc oxford
300 ## - PHYSICAL DESCRIPTION
Pages xi,245p.
Dimension 24cm.
650 ## - Subject
Subject Engineering
700 ## - Added Entry Personal Name
Relationship co author
Additional Author(s): smith,kenneth c
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Atpl Book
100 ## - MAIN ENTRY--PERSONAL NAME
-- 54736
650 ## - Subject
-- 8904
700 ## - Added Entry Personal Name
-- 54756
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Koha normalized classification for sorting Not for loan Location (home branch) Sublocation or collection (holding branch) Shelving location Date acquired Koha issues (times borrowed) Koha full call number Accession No. Koha date last seen Copy number Koha item type note
    Dewey Decimal Classification       test test General 21.05.2025 1 621.3815 clib24173031 21.05.2025 8 Atpl Book Aecc
    Dewey Decimal Classification       test test General 21.05.2025   621.3815 clib24173032 21.05.2025 1 Atpl Book Aecc
    Dewey Decimal Classification       test test General 21.05.2025 1 621.3815 clib24173033 21.05.2025 2 Atpl Book Aecc
    Dewey Decimal Classification       test test General 21.05.2025 1 621.3815 clib24173034 21.05.2025 3 Atpl Book Aecc
    Dewey Decimal Classification       test test General 21.05.2025   621.3815 clib24173035 21.05.2025 4 Atpl Book Aecc
    Dewey Decimal Classification       test test General 21.05.2025 1 621.3815 clib24173036 21.05.2025 5 Atpl Book Aecc
    Dewey Decimal Classification       test test General 21.05.2025 1 621.3815 clib24173037 21.05.2025 6 Atpl Book Aecc
    Dewey Decimal Classification       test test General 21.05.2025   621.3815 clib24173038 21.05.2025 7 Atpl Book Aecc

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